Position Mark Capture (MARK)

High speed, on-the-fly position capture synchronized to event trigger

Measurement applications, including AOI, probing, semiconductor packaging, and Coordinate Measurement Machines (CMMs), rely on the motion control system to precisely capture axis positions the moment a measurement is taken. ACS products provide registration mark position capture (MARK) functionality with sub-microsecond latency to enable the highest throughput.

Capabilities

• Enables on-the-fly capture of encoder positions with sub-micron accuracy and sub-microsecond latency
• Up to 2 kHz standard event capture frequency, higher frequencies possible
• Commonly used for notch/fiducial capture and alignment, CMM touch probe, vision-guided pick-place alignment